1. 異常趨勢與特殊原因變異偵測 (Nelson Rules)
Nelson, L. S. (1984). "The Shewhart Control Chart—Tests for Special Causes." Journal of Quality Technology, 16(4), 237-239.
2. 數據常態性檢定 (Anderson-Darling Test)
Stephens, M. A. (1974). "EDF Statistics for Goodness of Fit and Some Comparisons." Journal of the American Statistical Association, 69(347), 730-737.
Stephens, M. A. (1986). "Tests based on EDF statistics". In D'Agostino, R.B. and Stephens, M.A., eds., Goodness-of-Fit Techniques (Vol. 68, pp. 97-193). Marcel Dekker, New York.
3. 製程能力與績效指標 (Cp, Cpk, Pp, Ppk)
Kane, V. E. (1986). "Process Capability Indices." Journal of Quality Technology, 18(1), 41-52.
4. 統計品質管制界限常數 (I-MR Control Chart Constants)
Montgomery, D. C. (2020). Introduction to Statistical Quality Control (8th ed.). John Wiley & Sons.
5. 數值逼近：常態機率累加函數與反函數 (Normal CDF & InvNorm)
Abramowitz, M., & Stegun, I. A. (1964). Handbook of Mathematical Functions with Formulas, Graphs, and Mathematical Tables. National Bureau of Standards.